The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications.

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The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterization of the top atomic layer.

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The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.

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IONTOF USA is the US-based subsidiary of IONTOF. IONTOF is a German manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).

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The IONTOF USA sales team aims to help and support our potential customers to find the best solution for their specific problems. The sales team uses their own skills and expertise to solve issues and stay close to the customer.

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When help is needed there is no time to waste. For this reason, the IONTOF service department is available around the clock.

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