TOF.SIMS 5

TOF SIMS product: time-of-flight secondary ion mass spectrometry TOF.SIMS 5

Superior Performance for all SIMS Applications

The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications.

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Qtac 100

LEIS product: Quantitative Top Atomic Layer Characterization with Qtac

Quantitative Top Atomic Layer Characterization

The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterization of the top atomic layer.

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NanoScan VLS-80

SPM product: high vacuum scanning probe microscope

High-end Vacuum SPM Technology

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.

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Hybrid SIMS

Hybrid SIMS

With the new Q ExactiveTM Extension for its existing product line IONTOF introduces the first commercial SIMS instrument which combines highest mass resolution and highest mass accuracy with high resolution cluster SIMS imaging.

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SIMS / SPM Combination - 3D SIMS imaging

SIMS / SPM Combination

The new TOF.SIMS NCS platform combines all the well-known options of the high-end TOF.SIMS 5 with the possibility to perform in-situ SPM measurements.

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TOF-SIMS surface analysis: fib on cgs time-of-flight secondary ion mass spectrometry

FIB on GCS

Information about the chemical composition in 2D and 3D are of increasing interest. The TOF.SIMS 5 is a powerful tool to provide this kind of information on most sample systems. However, the 3D analysis of extremely rough samples, samples with voids, and samples that exhibit strong local variations in density or sputter yield is almost impossible for conventional SIMS depth profiling.

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IONTOF USA

IONTOF USA: TOF-SIMS and LEIS products manufacturing company

Our location in the USA

IONTOF USA is the US-based subsidiary of IONTOF. IONTOF is a German manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).

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Sales in the USA

TOF-SIMS and LEIS product sales in the USA

Sales information

The IONTOF USA sales team aims to help and support our potential customers to find the best solution for their specific problems. The sales team uses their own skills and expertise to solve issues and stay close to the customer.

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Service in the USA

Service for TOF-SIMS products and LEIS products from IONTOF in the USA

IONTOF Customer Support

When help is needed there is no time to waste. For this reason, the IONTOF service department is available around the clock.

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News

SurfaceLab 7.0 (1)
Jul 24 2018

SurfaceLab 7 version 7.0 build 99958 (bugfixing release 1) has just been released and is ... 
Some Facts
Jul 12 2018
The IONTOF software group is also very happy with the new SurfaceLab 7.0 release. After the hard ... 
SIMS Position
Jul 12 2018
The University of Nottingham is currently seeking a surface analysis postdoctoral scientist to join ... 
SurfaceLab 7.0
Jul 03 2018
IONTOF is happy to announce that SurfaceLab 7 has been released today. The new major release of our ... 

Upcoming Events

ALD 2018
Jul 2018
The AVS 18th International Conference on Atomic Layer Deposition (ALD 2018) featuring ... 
M&M 2018
Aug 2018
The Microscopy & Microanalysis 2018 Meeting will be held in Baltimore from August 5-9, 2018. ... 
SIMS Europe
Sep 2018
SIMS Europe 2018 will take place from September 16 (Sunday) to September 18 (Tuesday), 2018 in the ... 
Chinese SIMS Confere
Oct 2018
The next Chinese SIMS Conference will be organised by Prof Sunan Ding from the Suzhou Institute of ... 
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ION-TOF USA, Inc.
100 Red Schoolhouse Road
Building A8
Chestnut Ridge, NY 10977
(845) 352 - 8082
(845) 356 - 6304
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