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IONTOF USA
Support
Service
Sales
Download Area
Information Request
Analytical Service
Products
M6
M6 Plus
M6 Hybrid SIMS
Qtac
SurfaceLab 7
TOF-SIMS & LEIS Technique
Applications
Semiconductor
Polymer
Paints and Coatings
Biomaterials
Pharmaceuticals
Glass
Paper
Metals
Catalysts
Disclaimer
IONTOF USA
Support
Support
Service
When help is needed there is no time to waste.
The IONTOF USA service team is available.
Sales
The IONTOF sales team supports potential customers to find the best solution for their demands.
Find brochures and application notes here.
Download Area
The IONTOF download area for access to the SurfaceLab software updates, helpfiles and release notes.
Information Request
For information about our products and services, please complete the information request form.
Analytical Service
For analytical service IONTOF USA works in a close cooperation with Tascon USA, specialized in analytical service.
Products
SIMS Instrumentation
(Note: This information is provided on our international webpage)
M6
The latest, multi-purpose instrument guaranteeing superior performance in all application areas.
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M6 Product
M6 Plus
The M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.
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M6 Plus Product
M6 Hybrid SIMS
High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application.
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M6 Hybrid SIMS Product
Low Energy Ion Scattering
Qtac
Extremely surface sensitive instrument, providing unique and quantitative characterization of the top atomic layer.
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Qtac Product
Software
SurfaceLab 7
Versatile instrument operation, data acquisition and data analysis software package for all IONTOF instruments.
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SurfaceLab 7 software
How it works
TOF-SIMS and LEIS
Learn more about how advanced surface analysis works.
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TOF-SIMS / LEIS technique
Applications
Applications
(Note: This information is provided on our international webpage)
Semiconductor
The detection and quantification of trace metals is an important analytical task in the semiconductor industry.
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Semiconductor applications
Polymer
Discolourations on polymers are often caused by phase separation of the material's components.
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Polymer applications
Paints and Coatings
Coatings are of increasing importance for many industrial products for reasons of decoration as well as stability.
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Paints and Coatings applications
Biomaterials
The ability to image molecular compounds with high special resolution is very useful for biological applications.
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Biomaterials applications
Pharmaceuticals
SIMS can be used to determine the distribution of the different ingredients within pharmaceutical products.
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Pharmaceuticals applications
Glass
TOF-SIMS is a very powerful technique for the analysis of non-conductive materials e.g. glass.
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Glass applications
Paper
Paper surfaces are treated to obtain special surface properties. These modifications can be investigated.
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Paper applications
Metals
One major advantage of TOF-SIMS is the opportunity to combine high lateral and high depth resolution.
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Metals applications
Catalysts
For catalysis the characterization of the top atomic layer is essential. LEIS is the ideal technique for this application.
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Catalysts applications
The IONTOF products
For more detailed information about the IONTOF product line
please follow the link to our international webpage.
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The IONTOF product line
The M6
For more information about this IONTOF product please follow the link to our international webpage.
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The M6
The M6 Plus
For more information about this IONTOF product please follow the link to our international webpage.
External link
The M6 Plus
The M6 Hybrid SIMS
For more information about this IONTOF product please follow the link to our international webpage.
External link
The M6 Hybrid SIMS
The Qtac
For more information about this IONTOF product please follow the link to our international webpage.
External link
The Qtac
The SurfaceLab 7 sofware
For more information about the IONTOF product software please follow the link to our international webpage.
External link
The SurfaceLab 7 sofware
The TOF-SIMS / LEIS technique
For more information about this IONTOF product please follow the link to our international webpage.
External link
The TOF-SIMS / LEIS technique