IONTOF USA - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis

Innovative Ion Beam Technology for Surface Analysis

IONTOF USA is the US-based subsidiary of IONTOF. IONTOF is a German manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).

Founded in 1989 as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.
IONTOF USA was founded in 2000 to represent IONTOF and its’ product lines in the United States and provide high-class support to our existing TOF-SIMS and LEIS customers.

Today, IONTOF USA operates a full service network with highly trained service engineers located in different areas of the United States.
For analytical service and support with TOF-SIMS and LEIS, IONTOF USA works in a close cooperation with Tascon USA.
The Tascon team members are experts in field of surface analysis and are used to solve customer problems every day.