SurfaceLab 6.5 update
Sep 22, 2015
SurfaceLab 6 Version 6.5 build 75437 (bugfixing release 4) has just been released and is available for download from our download area:
IONTOF Download Area
The new setup does not include the online help files anymore. The help package is installed using the new seperate setup program. This arrangement allows us to update the online help more frequently and independly from software releases. You will find the new online help setup on our download area too.
SIMS XX, Day 4
Sep 17, 2015
Day 4 saw two ION-TOF presentations, "Simultaneous Analysis of Multiple 3D Datasets via Application of MVSA Techniques" by Henrik Arlinghaus and Dr. Ewald Niehuis gave an invited talk on "Recent Developments in ToF-SIMS Depth Profiling of Inorganic and Organic Thin Films". Both presentations were well received by the community and led to fruitful discussions.
Thursday also saw the end of the exhibit and we really appreciate everyone stopping by and spending time with the IONTOF team.
SIMS XX, Day 3
Sep 17, 2015
Day 3 of the conference had many interesting talks and the social events in the afternoon and evening provided an excellent opportunity to network with many attendees. The local committee organized three interesting tours with the chance to visit different Seattle landmarks, the EMP music museum or Museum of Flight.
In the evening all attendees took a boat trip to Blake Island, a beautiful 475-acre marine park. After a traditional Native American style salmon bake dinner we learned a lot about the traditional dances during the "Dance on the Wind" show. On the way back everybody enjoyed the fantastic skyline view.
SIMS XX, User Meeting
Sep 16, 2015
In the evening of day 2 we were pleased to host the IONTOF user´s dinner at the Seattle Aquarium. More than 150 users attended the event and took the time to enjoy the exhibition, food and drinks.
We are so pleased everyone could join us and even happier that everyone enjoyed the event as much as we did.
SIMS XX, Day 2
Sep 16, 2015
Day 2 saw some more great presentations at SIMS XX. The Biological Imaging session contained three presentation using the new hybrid TOF-SIMS/Orbitrap instrumentation. Carla Newman, Andy West (GSK) and Melissa Passarelli (NPL) all presented SIMS data with mass resolution over 200,000 and sub-ppm mass accuracy.
It was great to hear one attendee's comment, "it's really impressive to see two images with 0.04 amu mass difference, a real SIMS revolution".
So in the words of Thunderclap Newman (look them up if needed!), "... there's something in the air ... because the revolution's here"
SIMS XX, Seattle, WA
Sep 15, 2015
Today was the first full day of SIMS XX and the conference got off to a great start with a plenary talk from Dr. Ian Gilmore of NPL, UK discussing "A revolution in Chemical Imaging" including the first results from a "beyond state-of-the-art" SIMS instrument being developed with partners including ION-TOF.
The afternoon saw presentations from our own Derk Rading, "Depth Profiling of Inorganic Thin Films Using Large Oxygen Clusters" and Felix Kollmer, "Comparison of Conventional Dual Beam Depth Profiling with FIB/SIMS Cross Section Analysis".
We are looking forward to meeting many members of the extended ION-TOF family at our user dinner on Tuesday evening at the Seattle Aquarium.
High Sensitivity Detection of Impurities in Graphene
Sep 15, 2015
Graphene is currently the subject of intense research for its potential use in a wide variety of applications ranging from organic electronics to high strength materials. The properties of graphene are strongly influenced by the presence of structural defects and impurities. Because of this it is crucial to be able to characterize material properties in order to optimize performance. However, the monolayer structure of graphene presents a considerable challenge for most of the commonly used surface analysis techniques, such as XPS, which typically have a sampling depth which by far exceeds this layer thickness and includes the substrate.
Low Energy Ion Scattering (LEIS) is able to provide a sampling depth of a single monolayer which makes it ideally suited for observing the presence of impurities in freshly grown CVD graphene. Dr Stanislav Průša and colleagues at CEITEC (Brno University of Technology, Czech Republic) have recently used the high sensitivity of the Qtac 100 instrument to successfully detect and quantify the presence of such surface impurities. Their findings are presented in the scientific publication “Highly Sensitive detection of Surface and Intercalated Impurities in Graphene by LEIS” which is available for you to read online at
Detection of Impurities in Graphene
FIB / TOF-SIMS combination gains popularity
Mar 27, 2015
The TOF.SIMS 5 has always been the benchmark for TOF-SIMS depth profiling and 3D analysis. The combination of the high-current BI NANOPROBE along with high-performance sputter sources provides excellent detection limits and depth resolution in dual beam depth profiling mode.
However, 3D analysis of extremely rough and porous materials or samples that exhibit strong local variations in density or sputter yield are almost impossible for conventional SIMS to correctly depth profile. Typical examples for such samples are found in lithium battery and fuel cell research. In-situ FIB sample preparation is considered to provide an adequate solution for this type of application. A dedicated FIB source has been added to the TOF.SIMS 5 to expand the 3D analysis capabilities. By sequential sectioning of a FIB crater sidewall and intermediate TOF-SIMS imaging analysis full three-dimensional tomography measurements can be performed.
Since the introduction of the TOF-SIMS / FIB option two years ago, more than ten SIMS systems equipped with this device have been successfully installed.
SurfaceLab 6.5 Software Release
Nov 02, 2014
We are pleased to announce the release of SurfaceLab 6.5 which is the latest version of the instrument control and data analysis software suite for IONTOF TOF-SIMS and Qtac systems. This update is part of our ongoing commitment to SurfaceLab software development to build on existing functionality, improve performance and enhance stability.
New SurfaceLab features included in version 6.5:
Advanced time of flight correction
This feature enables individual adjustment of the mass calibration for each pixel composing an ion image to be performed and thereby obtain optimal mass resolution data from topographical samples.
3D height correction by defining a flat interface/substrate
Real world samples are often not flat and have lateral structure. SurfaceLab now enables the user to specify the depth of surface/interface features in a material and thereby establish correct representation in depth profiles of complex structures.
Profile line arithmetic functions
This new functionality allows mass intervals composing depth profiles to be linearly combined, multipled and divided. This feature is particular useful for the combination of isotope signals from an element, or molecular fragment ions signal from a monomer, to produce a single depth profile with greater signal intensity and better data statistics.
Improved EDR operation
The user interface includes a preview of the active mass ranges of EDR operation. In addition, automatic signal intensity based switching of EDR operation in the selected mass ranges has now been implemented.
The latest version of SurfaceLab is available for users to download from the IONTOF website.