Atomic layer deposition (ALD) is used to fabricate ultrathin and conformal thin film structures. The Conference on atomic layer deposition is dedicated to the science and technology of the technique. During the exhibition Dr Nathan Havercroft from IONTOF USA and Philipp Brüner from the LEIS development team will be at the booth and available for technical and scientific discussions.
Webpage: ALD 2015
The 2015 International Conference on Secondary Ion Mass Spectrometry will provide a forum for colleagues from both academia and industries throughout the world to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques. IONTOF is diamond sponsor for this event and many of our system specialists will attend the meeting and will be happy to discuss scientific and technical details with the attendees.
Webpage: SIMS XX
The European Conference on Applications of Surface and Interface Analysis (ECASIA) focuses on and the use of surface analytical, surface specific or surface sensitive techniques for applied purposes. It covers all aspects of biological, chemical and physical interactions at interfaces. IONTOF is gold sponsor and will have a booth at the exhibition.
Webpage: ECASIA 2015
The AVS International Symposium and Exhibition addresses cutting-edge issues associated with materials, processing, and interfaces in both the research and manufacturing communities. The weeklong Symposium fosters a multidisciplinary environment that cuts across traditional boundaries between disciplines, featuring papers from AVS technical divisions, technology groups, and focus topics on emerging technologies. The equipment exhibition is one of the largest in the world and provides an excellent opportunity to view the latest products and services offered by over 200 participating companies. More than 2,000 scientists and engineers gather from around the world to attend.
IONTOF is both a corporate member and sponsor and will be available at booth 621 to answer all your questions.
Webpage: AVS 2015