We wish you a prosperous, successful New Year and would like to thank you for your co-operation and trust in IONTOF.
The pre-release of SurfaceLab 6.6 will be released today. The new version comes with a multitude of new features and refinements which will further improve the way you work with the systems and handle your data. A few of the many new options are:
Analysis and edit mode for peak lists
This new feature allows you to store modifications of a peak list with an analysis. It is now possible to toggle the display of the peak list between two modes. In the analysis mode the displayed peak list shows all the mass intervals as they have been set during the generation of the data. In edit mode you can now change the settings of the peak list e.g. change the interval limits or add new mass intervals. You can now use the modified peak lists for data evaluation and store your results together with the original spectrum without reconstruction.
Cross-program display of selected mass intervals
You can now display data previews across the different programs. This features allows one to see the image of a selected mass interval inside the spectra program, the spectrum inside the image program and the spectrum and image information inside the profile program. The options makes cross checking of peak properties much faster without the need to switch between programs.
Z-ROI synchronization of cross-program previews
All cross-program previews are synchronized with the selected Z-ROIs. This option allows you to generate previews of spectra and images within a selected Z-ROI in real time without time consuming data reconstruction.
Combinable worksheet cells
The image program now allows the combination of single cells in the worksheet to display a larger selected image.
Virtual sample potential slider for the TOF analyzer
This new slider allows one to adjust the TOF analyzer setting for insulating samples. All related parameters such as extractor, energy, lens, reflector, XY raster, XY sensitivity, post-acceleration and all EDR parameters will be automatically adjusted. As a consequence the pass energy of the secondary ions, the mass range, the mass scale and all EDR parameters remain constant. No further mass or EDR calibration is necessary.
Improved automated beam current measurement
The automated beam current measurement routine has been improved to save time whilst retaining the same level of accuracy. The new procedure is now performed more than three times faster. This feature significantly reduces overhead during fully automated operation and optimizes sample throughput.
The new pre-release will soon be available for download from our download area:
IONTOF Download Area
The setup does not include the online help files anymore. The help package is installed using the new separate setup program. This arrangement allows us to update the online help more frequently and independently from software releases. You will find the new online help setup on our download area too.
IONTOF is developing a new combination instrument in the framework of the “3D nanoSIMS - label-free molecular imaging” project. The aim of the project initiated by Prof. Ian Gilmore from NPL in the UK is to combine our high-performance TOF-SIMS with the extremely powerful Q ExactiveTM mass analyzer from Thermo ScientificTM. The project began at the end of 2013 and will be completed in 2016 with the delivery of the first instrument to NPL.
The well-known OrbitrapTM mass spectrometer (Thermo ScientificTM Q ExactiveTM HF) is a powerful addition to the conventional TOF.SIMS 5 in a dual-analyzer configuration with secondary ion beam switching. The OrbitrapTM analyzer provides a mass resolving power of 240,000 @ m/z 200 and a mass accuracy of <1 ppm. In combination with a new gas cluster source (GCS) high-resolution images with a lateral resolution of better than 2 µm can be acquired without any static SIMS limitations. The Q ExactiveTM product line also offers comprehensive MS/MS capabilities with precise precursor selection, full mass resolution and mass accuracy, bringing real, high-performance MS/MS to the field of SIMS for the first time.
The new Hybrid SIMS instrument has been in operation at the IONTOF R&D facility for a few months and the initial results are very exciting.
SurfaceLab 6 Version 6.5 build 77427 (bugfixing release 8) has just been released and is available for download from our download area:
IONTOF Download Area
The new setup does not include the online help files anymore. The help package is installed using the new separate setup program. This arrangement allows us to update the online help more frequently and independently from software releases. You will find the new online help setup on our download area too.