Innovative Ion Beam Technology for Surface Analysis
IONTOF USA is the US-based subsidiary of IONTOF. IONTOF is a German manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
Founded in 1989 as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.
IONTOF USA was founded in 2000 to represent IONTOF and itsí product lines in the United States and provide high-class support to our existing TOF-SIMS and LEIS customers.
Today, IONTOF USA operates a full service network with highly trained service engineers located in different areas of the United States.
For analytical service and support with TOF-SIMS and LEIS, IONTOF USA works in a close cooperation with Tascon USA.
The Tascon team members are experts in field of surface analysis and are used to solve customer problems every day.