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Company Development 25 years of TOF-SIMS Development ION-TOF USA, Inc. is a subsidiary of ION-TOF GmbH, the leading European manufacturer of Time-of-Flight Secondary Ion Mass Spectrometers (TOF-SIMS) for surface analysis. ION-TOF GmbH was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialize the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the original conception, the contribution of Muenster by its academics and entrepreneurs to the development and spread of the TOF-SIMS technique has been significant and unceasing. Muenster is certainly the place to visit if you want to know the latest about TOF-SIMS. TOF-SIMS has become a standard requirement for a surface analysis laboratory, and has overtaken other longer established surface techniques, both in the performance and the number of units now being sold. Since the technique became commercially viable ION-TOF has made many product improvements, and more than 100 instruments are in operation in industrial and academic laboratories worldwide. ION-TOF's success is based on the longstanding SIMS experience and skills of our scientists and engineers, the support given to our customers and the close co-operation with them, and a dedication to supply a good, efficient product to match the demands of the modern users. ION-TOF's engineers are not solely involved in developing equipment; basic research is also carried out. Consequently ION-TOF is part of the national German competence centre "nanoanalytics". The ION-TOF premises are in a science park close to the University, the Technologiehof, the Centre for Nanotechnology ( CeNTech ) and the Max-Planck Institute for Cell Biology, which is practical for collaboration and provides a stimulating working environment. The involvement in nanoscience projects enables us to understand the instrumental requirements for nanoscience and design them into our instruments. ION-TOF is also an important partner in many other national and international surface science projects. ION-TOF continues to make considerable development effort. Its policy to build the most innovative ion beam technology for surface science, and the continued investment in the development of our instruments will produce new instruments with even better performance. In particular ION-TOF works in close co-operation with its sister company TASCON, located in the same building, set up to provide analytical services, and provide demonstration and applications facilities. The co-operation with TASCON's applications experts enables us to investigate new applications for the TOF-SIMS technique to expand its use even further. |
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More than 170 instruments in operation worldwide. |