ION-TOF is proud to announce that the very successful TOF.SIMS 5 has now been sold more than a hundred times. In December 2009 ION-TOF received orders, 100 and 101. The one hundredth instrument will be installed at the Ulsan National Institute of Science and Technology (UNIST) in South Korea.

TOF.SIMS 5

As previously announced, ION-TOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.

NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).

We are pleased to inform that ION-TOF GmbH will now channel all related marketing and sales efforts in Muenster. Together with the skilled scientists at NanoScan, the experienced ION-TOF sales team is looking forward to extending the market for these extraordinary devices.

If you would like additional information please contact sales@iontof.com.
 

ION-TOF GmbH is pleased to announce the successful installation of its first Qtac instrument in the Department of Catalysis and Materials at the University of Lille in France. After a smooth and punctual acceptance, the system has now begun routine operation and will support the users in gaining valuable information about their samples, which include materials such as catalysts, metals and polymers.

The Qtac, which is able to measure the properties of the first monolayer of the sample, has been supplied in combination with a TOF.SIMS 5 and an Axis Ultra XPS from Kratos Analytical Ltd. The complementary analysis capabilities of these instruments provide the University of Lille with a very powerful surface analysis system.

We wish the University of Lille every success in their research endeavors using the new system!

 
 
LEIS, TOF-SIMS, XPS combination instrument at the University of Lille
 

We are pleased to announce that we have some used instruments for sale at the moment. There are older TOF-SIMS IV type instruments available as well as instruments of the current type TOF.SIMS 5. The latter have previously been used as demonstration or R & D equipment.

Prices start from 200,000.00 EUR, depending on the configuration and on upgrades you may wish to purchase. All instruments are in a very good condition and have undergone thorough functionality tests at ION-TOF GmbH.

If you would like additional information or if you are interested in obtaining a quotation for any of the above-mentioned instruments please contact sales@iontof.com.
 
 

We are pleased to announce that ION-TOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.

NanoScan Ltd. is a spin-off company of the University of Basel. The company was set up in 2003, when the initiators at the Institute of Physics developed a prototype of their high-resolution Magnetic Force Microscope capable of enhancing the resolution by a factor of ten compared to other available microscopes.

Today, NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).

After the acquisition NanoScan will remain an independent company in Switzerland. Dr. Raphaëlle Dianoux has been appointed CEO and will lead the company together with Dr. Guido Tarrach as CTO. Both scientists have long-term experience in the development and the application of scanning probe microscopy.

This acquisition will grant ION-TOF access to new technologies in the field of nanoscience, thus strengthening our position as a leading manufacturer of instrumentation for surface analysis. We are certain that our future product lines will benefit from these new technologies.