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IONTOF USA
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For information about our products and services, please complete the information request form.
Analytical Service
For analytical service IONTOF USA works in a close cooperation with Tascon USA, specialized in analytical service.
Products
SIMS Instrumentation       (Note: This information is provided on our international webpage)
M6
The latest, multi-purpose instrument guaranteeing superior performance in all application areas.

External link  M6 Product
M6 Plus
The M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.

External link  M6 Plus Product
M6 Hybrid SIMS
High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application.

External link  M6 Hybrid SIMS Product
Low Energy Ion Scattering
Qtac
Extremely surface sensitive instrument, providing unique and quantitative characterization of the top atomic layer.

External link  Qtac Product
Software
SurfaceLab 7
Versatile instrument operation, data acquisition and data analysis software package for all IONTOF instruments.

External link  SurfaceLab 7 software
How it works
TOF-SIMS and LEIS
Learn more about how advanced surface analysis works.

External link  TOF-SIMS / LEIS technique
Applications
Applications       (Note: This information is provided on our international webpage)
Semiconductor
The detection and quantification of trace metals is an important analytical task in the semiconductor industry.

External link  Semiconductor applications
Polymer
Discolourations on polymers are often caused by phase separation of the material's components.

External link  Polymer applications
Paints and Coatings
Coatings are of increasing importance for many industrial products for reasons of decoration as well as stability.

External link  Paints and Coatings applications
Biomaterials
The ability to image molecular compounds with high special resolution is very useful for biological applications.

External link  Biomaterials applications
Pharmaceuticals
SIMS can be used to determine the distribution of the different ingredients within pharmaceutical products.

External link  Pharmaceuticals applications
Glass
TOF-SIMS is a very powerful technique for the analysis of non-conductive materials e.g. glass.

External link  Glass applications
Paper
Paper surfaces are treated to obtain special surface properties. These modifications can be investigated.

External link  Paper applications
Metals
One major advantage of TOF-SIMS is the opportunity to combine high lateral and high depth resolution.

External link  Metals applications
Catalysts
For catalysis the characterization of the top atomic layer is essential. LEIS is the ideal technique for this application.

External link  Catalysts applications
IONTOF Information Request
For information about our products, please complete the following form and click "Send Request".
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TitleIONTOF-TOF-SIMS-TIME-OF-FLIGHT-SURFACE-ANALYSIS
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Main interests
TOF-SIMS
LEIS
SPM

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Metals
Semiconductors
Polymers
General Organic
Other materials, specify
      
Surface identification
Trace concentrations
Depth profiles
3D
Large specimens
Heating and cooling during analysis
Attached sample preparation chamber
Attached to another instrument (XPS etc)

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Already LEIS user

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ION-TOF USA, Inc.

100 Red Schoolhouse Road

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Email
(845) 352 - 8082

(845) 356 - 6304

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